Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link |
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2014 | The study of temperature dependent strain in Ge epilayer with SiGe/Ge buffer layer on Si substrate with different thickness | Wu, P. H.; Huang, Y. S.; Hsu, H. P.; Li, C.; Huang, S. H.; Kwong-Kau Tiong | Applied Physics Letters | 5 |