Issue Date | Title | Author(s) | ???itemlist.dc.relation.ispartof??? | ???itemlist.crismetrics_wos??? | ???itemlist.bitstreamformat??? |
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2010 | Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation | Shiu, J. Y.; Lu, C. Y.; Su, T. Y.; Rong-Tan Huang ; Zirath, H.; Rorsman, N.; Chang, E. Y. | Japanese Journal of Applied Physics |