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Showing results 84 to 93 of 93 < previous 
Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
2010Relationship between gray matter volume and age in 274 healthy Japanese children applying voxel-based morphometric analysisTaki, Y.; Hashizume, H.; Sassa, Y.; Takeuchi, H.; Wu Kai ; Nouchi, R.; Kotozaki, Y.; Asano, K.; Asano, M.; Fukuda, H.; Kawashima, R.Neuroscience Research
2013Seismic behavior of shallow foundations during major earthquakes and artificial symmetrical shakes based on a three-dimensional effective stress analysisWei, L. C.; Yi, L. H.; 開物 ; Tung-Chin, K. G.; Yang, C. B.; Kanti, P.; Shobha, C.; Shankar, G.Disaster Advances
2018Single-Layer Circularly Polarized Wide Band Reflectarray Antenna with High Aperture EfficiencyDa, X. Y.; Wu, J. L.; Jing, Z.; Lin, B. Q.; Wu Kai International Journal of Antennas and Propagation
2002Strain-rate effects on superplastic properties of coarse-grained iron aluminides: a microstructural examinationChu, J. P.; Wu Kai ; Yasuda, H. Y.; Umakoshi, Y.; Inoue, K.Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing
2001Sulfidation Behavior of Inconel 738 Superalloy at 500–900°CWu Kai ; Lee, C. H.; Lee, T. W.; Wu, C. H.Oxidation of Metals
2004The Sulfidation of Inconel 738 in H2/H2S/Ar Gas Mixture at 500–900°CWu Kai ; Lin, Y. T.; Yu, C. C.; Chen, P. C.; Wu, C. H.Oxidation of Metals
1998Superplastic deformation in coarse-grained Fe–27A1 alloysJ.P.Chu; I.M.Liu; J.H.Wu; Wu Kai ; J.Y.Wang; K.InoueMaterials Science and Engineering: A
2010The oxidation behavior of a Ti50Cu28Ni15Sn7 bulk metallic glass at 400-500 degrees CKao, P. C.; Chen, W. S.; Lin, C. L.; Xiao, Z. H.; Hsu, C. F.; Pee-Yew Lee ; Wu Kai Journal of Alloys and Compounds8
2017Warpage and Thermal Characterization of Fan-Out Wafer-Level PackagingLau, J. H.; Li, M.; Tian, D. W.; Fan, N.; Kuah, E.; Wu Kai ; Hao, J.; Cheung, Y. M.; Li, Z.; Tan, K. H.; Beica, R.; Taylor, T.; Ko, C. T.; Yang, H.; Chen, Y. H.; Lim, S. P.; Lee, N. C.; Ran, J.; Xi, C.; Wee, K. S.; Yong, Q. X.Ieee Transactions on Components Packaging and Manufacturing Technology
2018Warpage Measurements and Characterizations of Fan-Out Wafer-Level Packaging With Large Chips and Multiple Redistributed LayersLau, J. H.; Li, M.; Yang, L.; Xu, I.; Chen, T.; Chen, S.; Yong, Q. X.; Madhukumar, J. P.; Wu Kai ; Fan, N.; Kuah, E.; Li, Z.; Tan, K. H.; Bao, W.; Lim, S. P.; Beica, R.; Ko, C. T.; Xi, C.Ieee Transactions on Components Packaging and Manufacturing Technology
Showing results 84 to 93 of 93 < previous 
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