Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link |
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2011 | Robust High-Resistance State and Improved Endurance of HfOX Resistive Memory by Suppression of Current Overshoot | Chen, Y. S.; Lee, H. Y.; Chen, P. S.; Liu, W. H.; Wang, S. M.; Gu, P. Y.; Hsu, Y. Y.; Chen-Han Tsai ; Chen, W. S.; Chen, F.; Tsai, M. J.; Lien, C. | Ieee Electron Device Letters | ||
2009 | Structural and Dielectric Properties of Sputter-Deposited Ba0.48Sr0.52TiO3/LaNiO3 Artificial Superlattice Films | Lee, H. Y.; Liu, H. J.; Yuan-Chang Liang ; Wu, K. F.; Lee, C. H. | Journal of the Electrochemical Society | 7 | |
2004 | Structural characteristics of epitaxial BaTiO3/LaNiO3 superlattice | Yuan-Chang Liang ; Wu, T. B.; Lee, H. Y.; Hsieh, Y. W. | Journal of Applied Physics | 40 | |
2006 | Structural characterization of sputter-deposited Ba0.48Sr0.52TiO3/LaNiO3 artificial superlattice structure by X-ray reflectivity and diffraction | Lee, H. Y.; Wu, K. F.; Liu, H. J.; Lee, C. H.; Yuan-Chang Liang | Thin Solid Films | 3 | |
2006 | Surface evolution and dynamic scaling of heteroepitaxial growth of (La,Ba)MnO3 films on SrTiO3 substrates by rf magnetron sputtering | Yuan-Chang Liang ; Lee, H. Y.; Liu, H. J.; Wu, K. F.; Wu, T. B. | Thin Solid Films | 7 | |
2004 | X-ray reflectivity study of the structural characteristics of BaTiO3/LaNiO3 superlattice | Yuan-Chang Liang ; Wu, T. B.; Lee, H. Y.; Liu, H. J. | Thin Solid Films | 14 |