公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 |
---|---|---|---|---|---|
2009 | An unsupervised neural network approach for automatic semiconductor wafer defect inspection | Chang, C. Y.; Li, C. H.; Chang, J. W.; Mu-Der Jeng | Expert Systems with Applications | ||
2012 | VARIATION OF CALCIUM LEVELS IN THE TISSUES AND HEMOLYMPH OF LITOPENAEUS VANNAMEI AT VARIOUS MOLTING STAGES AND SALINITIES | Li, C. H.; Sha-Yen Cheng | Journal of Crustacean Biology | ||
2011 | Wafer defect inspection by neural analysis of region features | Chang, C. Y.; Li, C. H.; Chang, Y. C.; Mu-Der Jeng | Journal of Intelligent Manufacturing |