| 公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 |
|---|---|---|---|---|---|
| 2006 | Demonstrating applications of non-optically regulated tapping-mode near-field scanning optical microscopy to nano-optical metrology and optical characterization of semiconductors | Nien Hua Lu; Shuen De Chang; Guan-Bin Huang; Hung Ji Huang; Ying Sheng Huang; Hai-Pang Chiang ; Din Ping Tsai | Japanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers | 2 |
