公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 |
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2010 | Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation | Shiu, J. Y.; Lu, C. Y.; Su, T. Y.; Rong-Tan Huang ; Zirath, H.; Rorsman, N.; Chang, E. Y. | Japanese Journal of Applied Physics |