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Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 2006 | Gate-metal formation-related kink effect and gate current on In0.5Al0.5As/In0.5Ga0.5As metamorphic high electron mobility transistor performance | Hsu, M. K.; Chen, H. R.; Chiou, S. Y.; Chen, W. T.; Chen, G. H.; Chang, Y. C.; Wen-Shiung Lour | Applied Physics Letters | 14 |