第 1 到 2 筆結果,共 2 筆。
公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 | |
---|---|---|---|---|---|---|
1 | 2011 | Wafer defect inspection by neural analysis of region features | Chang, C. Y.; Li, C. H.; Chang, Y. C.; Mu-Der Jeng | Journal of Intelligent Manufacturing | ||
2 | 2011 | Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection | Li, C. H.; Chang, C. Y.; Mu-Der Jeng | Ieee Transactions on Systems Man and Cybernetics Part C-Applications and Reviews |