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Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 2013 | Characterization of Ge/Si0.16Ge0.84 multiple quantum wells on Ge-on-Si virtual substrate using piezoreflectance spectroscopy | Wu, P. H.; Huang, Y. S.; Hsu, H. P.; Li, C.; Huang, S. H.; Kwong-Kau Tiong | Solid State Communications | 1 | |
2 | 2013 | Temperature dependent surface photovoltage spectra of type I GaAs1-xSbx/GaAs multiple quantum well structures | Sitarek, P.; Misiewicz, J.; Huang, Y. S.; Hsu, H. P.; Kwong-Kau Tiong | Journal of Applied Physics | 4 | |
3 | 2013 | Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual Substrate | Hsu, H. P.; Yang, P. H.; Huang, J. K.; Wu, P. H.; Huang, Y. S.; Li, C.; Huang, S. H.; Kwong-Kau Tiong | Advances in Condensed Matter Physics | 2 |