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Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 2008 | A Study of AIEM Model for Bistatic Surface Scattering from Randomly Rough Surfaces | Tzong-Dar Wu ; K. S. Chen; J. C. Shi; H. W. Lee; A. K. Fung | IEEE Trans. Geosci. Remote Sensing |