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Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 2003 | Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures | Liang, J. S.; Wang, S. D.; Huang, Y. S.; Tien, C. W.; Chang, Y. M.; Chen, C. W.; Li, N. Y.; Kwong-Kau Tiong ; Pollak, F. H. | Journal of Physics-Condensed Matter | 11 |