第 1 到 2 筆結果,共 2 筆。
公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 | |
---|---|---|---|---|---|---|
1 | 2009 | Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection | Chang, C. Y.; Li, C. H.; Lin, S. Y.; Mu-Der Jeng | Ieee Transactions on Systems Man and Cybernetics Part C-Applications and Reviews | ||
2 | 2009 | An unsupervised neural network approach for automatic semiconductor wafer defect inspection | Chang, C. Y.; Li, C. H.; Chang, J. W.; Mu-Der Jeng | Expert Systems with Applications |