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Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link | |
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1 | 2009 | Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection | Chang, C. Y.; Li, C. H.; Lin, S. Y.; Mu-Der Jeng | Ieee Transactions on Systems Man and Cybernetics Part C-Applications and Reviews | ||
2 | 2009 | An unsupervised neural network approach for automatic semiconductor wafer defect inspection | Chang, C. Y.; Li, C. H.; Chang, J. W.; Mu-Der Jeng | Expert Systems with Applications |