第 1 到 4 筆結果,共 4 筆。
公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 | |
---|---|---|---|---|---|---|
1 | 2011 | Wafer defect inspection by neural analysis of region features | Chang, C. Y.; Li, C. H.; Chang, Y. C.; Mu-Der Jeng | Journal of Intelligent Manufacturing | ||
2 | 2011 | Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection | Li, C. H.; Chang, C. Y.; Mu-Der Jeng | Ieee Transactions on Systems Man and Cybernetics Part C-Applications and Reviews | ||
3 | 2011 | A Fuzzy K-means Clustering Algorithm Using Cluster Center Displacement | Chang, C. T.; Lai, J. Z. C.; Mu-Der Jeng | Journal of Information Science and Engineering | ||
4 | 2011 | Codebook Generation Using Partition and Agglomerative Clustering | Chang, C. T.; Lai, J. Z. C.; Mu-Der Jeng | Advances in Electrical and Computer Engineering |