http://scholars.ntou.edu.tw/handle/123456789/10787| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.author | Chen, Y. S. | en_US |
| dc.contributor.author | Lee, H. Y. | en_US |
| dc.contributor.author | Chen, P. S. | en_US |
| dc.contributor.author | Gu, P. Y. | en_US |
| dc.contributor.author | Liu, W. H. | en_US |
| dc.contributor.author | Chen, W. S. | en_US |
| dc.contributor.author | Hsu, Y. Y. | en_US |
| dc.contributor.author | Chen-Han Tsai | en_US |
| dc.contributor.author | Chen, F. | en_US |
| dc.contributor.author | Tsai, M. J. | en_US |
| dc.contributor.author | Lien, C. H. | en_US |
| dc.date.accessioned | 2020-11-21T06:36:55Z | - |
| dc.date.available | 2020-11-21T06:36:55Z | - |
| dc.date.issued | 2011-03 | - |
| dc.identifier.issn | 0741-3106 | - |
| dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/10787 | - |
| dc.relation.ispartof | Ieee Electron Device Letters | en_US |
| dc.title | Good Endurance and Memory Window for Ti/HfOx Pillar RRAM at 50-nm Scale by Optimal Encapsulation Layer | en_US |
| dc.type | journal article | en_US |
| dc.identifier.doi | 10.1109/led.2010.2099201 | - |
| dc.identifier.doi | <Go to ISI>://WOS:000287658400056 | - |
| dc.identifier.url | <Go to ISI>://WOS:000287658400056 | |
| dc.relation.journalvolume | 32 | en_US |
| dc.relation.journalissue | 3 | en_US |
| item.cerifentitytype | Publications | - |
| item.openairetype | journal article | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.fulltext | no fulltext | - |
| item.grantfulltext | none | - |
| crisitem.author.dept | College of Ocean Science and Resource | - |
| crisitem.author.dept | Department of Marine Environmental Informatics | - |
| crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | College of Ocean Science and Resource | - |
| 顯示於： | 海洋環境資訊系 | |
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