http://scholars.ntou.edu.tw/handle/123456789/15958
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hai-Pang Chiang | en_US |
dc.contributor.author | Jing-Lun Lin | en_US |
dc.contributor.author | Railing Chang | en_US |
dc.contributor.author | Zhi-Wei Chen | en_US |
dc.contributor.author | Pui Tak Leung | en_US |
dc.date.accessioned | 2021-02-24T05:32:36Z | - |
dc.date.available | 2021-02-24T05:32:36Z | - |
dc.date.issued | 2005-11-10 | - |
dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/15958 | - |
dc.description.abstract | We have recently demonstrated that ultra high resolution of angular measurement down to 10-6 degree can be achieved via surface-plasmon-resonance heterodyne interferometry, in which the phase difference between p- and s- polarized reflected waves is monitored as a function of the incident angle. Here we give a brief summary of this technique and the rationale based on which such a measurement is possible. As a further study, we have also investigated, via simulation, how the change in environmental temperature will affect the resolution limit of this very versatile technique. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Society of Photo-Optical Instrumentation Engineers (SPIE) | en_US |
dc.relation.ispartof | Nanofabrication: Technologies, Devices, and Applications II | en_US |
dc.title | High resolution angular measurement using surface-plasmon-resonance heterodyne interferometry at optimal incident wavelengths | en_US |
dc.type | journal article | en_US |
dc.identifier.doi | 10.1117/12.630594 | - |
dc.relation.journalvolume | 6002 | en_US |
dc.relation.pages | 600218 | en_US |
item.cerifentitytype | Publications | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.languageiso639-1 | en | - |
crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
crisitem.author.dept | Department of Optoelectronics and Materials Technology | - |
crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
crisitem.author.dept | Department of Optoelectronics and Materials Technology | - |
crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
crisitem.author.orcid | 0000-0003-0752-175X | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
顯示於: | 光電與材料科技學系 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。