http://scholars.ntou.edu.tw/handle/123456789/1821
標題: | Imaging layer number and stacking order through formulating Raman fingerprints obtained from hexagonal single crystals of few layer graphene |
作者: | Jih-Shang Hwang Yu-Hsiang Lin Jeong-Yuan Hwang Railing Chang Surojit Chattopadhyay Chang-Jiang Chen Peilin Chen Hai-Pang Chiang Tsong-Ru Tsai Li-Chyong Chen Kuei-Hsien Chen |
公開日期: | 11-一月-2013 |
出版社: | IOP Publishing |
卷: | 24 |
期: | 1 |
起(迄)頁: | 015702 |
來源出版物: | Nanotechnology |
摘要: | Quantitative mapping of layer number and stacking order for CVD-grown graphene layers is realized by formulating Raman fingerprints obtained on two stepwise stacked graphene single-crystal domains with AB Bernal and turbostratic stacking (with ~30°interlayer rotation), respectively. The integrated peak area ratio of the G band to the Si band, AG/ASi, is proven to be a good fingerprint for layer nu... |
URI: | http://scholars.ntou.edu.tw/handle/123456789/1821 |
ISSN: | 0957-4484 |
DOI: | 10.1088/0957-4484/24/1/015702 |
顯示於: | 光電與材料科技學系 |
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