http://scholars.ntou.edu.tw/handle/123456789/22008
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Suryarasmi, Anindita | en_US |
dc.contributor.author | Chang, Chin-Chun | en_US |
dc.contributor.author | Akhmalia, Rania | en_US |
dc.contributor.author | Marshallia, Maysa | en_US |
dc.contributor.author | Wang, Wei-Jen | en_US |
dc.contributor.author | Liang, Deron | en_US |
dc.date.accessioned | 2022-07-01T01:53:04Z | - |
dc.date.available | 2022-07-01T01:53:04Z | - |
dc.date.issued | 2022-07-01 | - |
dc.identifier.issn | 0141-9382 | - |
dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/22008 | - |
dc.description.abstract | Deep learning technologies based on Convolution Neural Networks (CNN) have been widely used in fabric defect detection. On-site CNN model training and defect detection offer several desirable properties for the fabric manufactures, such as better data security and less connectivity requirements, when compared with the on-cloud training approach. However, computers installed at the manufacturing site are usually industrial computers with limited computing power, which are not able to run many effective CNN models. A lightweight CNN model should be used in this scenario, in order to find a balance point among defect detection, efficiency, memory consumption and model training time. This paper presents a lightweight CNN-based architecture for fabric defect detection. Compared with VGG16, MobileNetV2, EfficientNet, and DenseNet as state-of-the-art architectures, the proposed architecture, namely FN-Net, can perform training 3 to 33 times as fast as these architectures with less graphics processing unit and memory consumption. With adaptive class determination, FN-Net has an average F1 score 0.86, while VGG16 and EfficientNet as the best and the worst among the baseline models have 0.81 and 0.50, respectively. | en_US |
dc.language.iso | English | en_US |
dc.publisher | ELSEVIER | en_US |
dc.relation.ispartof | DISPLAYS | en_US |
dc.subject | Artificial intelligence | en_US |
dc.subject | Lightweight convolutional neural network | en_US |
dc.subject | Fabric manufacturing | en_US |
dc.subject | AOI | en_US |
dc.subject | Defect detection | en_US |
dc.title | FN-Net: A lightweight CNN-based architecture for fabric defect detection with adaptive threshold-based class determination | en_US |
dc.type | journal article | en_US |
dc.identifier.doi | 10.1016/j.displa.2022.102241 | - |
dc.identifier.isi | WOS:000807821600002 | - |
dc.relation.journalvolume | 73 | en_US |
dc.identifier.eissn | 1872-7387 | - |
item.cerifentitytype | Publications | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.languageiso639-1 | English | - |
crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
crisitem.author.dept | Department of Computer Science and Engineering | - |
crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
Appears in Collections: | 資訊工程學系 |
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