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  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 資訊工程學系
Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/26433
DC FieldValueLanguage
dc.contributor.authorNi, Yan-Qinen_US
dc.contributor.authorHuang, Pei-Kaien_US
dc.contributor.authorYang, Ching-Hanen_US
dc.contributor.authorChang, Chin-Chunen_US
dc.contributor.authorWang, Wei-Jenen_US
dc.contributor.authorLiang, Deronen_US
dc.date.accessioned2026-03-12T03:36:39Z-
dc.date.available2026-03-12T03:36:39Z-
dc.date.issued2025/1/1-
dc.identifier.issn2169-3536-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/26433-
dc.description.abstractIn industrial production, automated inspection methods for circular knitting machines often encounter several challenges. First, the rapid movement of fabrics on these machines makes it difficult for existing fabric defect detection methods to effectively capture and process the motion. Next, due to practical constraints aimed at maintaining high yield rates, collecting sufficient abnormal fabric samples for model training is costly and limited. Furthermore, circular knitting machines typically operate under varying illumination conditions, further complicating the task of accurate fabric defect detection. Additionally, these methods usually fail to identify the cutline patterns that are integral to the design of the fabric and mistake cutlines for v-line defects. Therefore, existing fabric defect detection methods often struggle to balance real-time processing, few-shot learning, and high accuracy under various illumination conditions To address the aforementioned challenges, we adopt a few-shot learning approach and propose a novel real-time fabric defect detection method for circular knitting machines, aiming to achieve high accuracy even under varying illumination conditions. The proposed mechanism consists of two components, the LBUnet and the false alarm filter for cutlines. First, to tackle the challenges of real-time detection, limited training data, and varying illumination conditions, we develop a lightweight semantic segmentation model, LBUnet, which leverages local binary (LB) convolution to effectively handle variable lighting conditions. Next, to address the specific challenge of detecting V-line defects, we propose a false-alarm filtering method that ensures accurate defect identification by utilizing time-series data composed of consecutive segmentation maps generated by LBUnet. Extensive experiments demonstrate that the proposed method delivers both high defect detection accuracy and real-time processing performance for fast-moving fabrics on circular knitting machines under diverse lighting conditions. Specifically, using only LBUnet, our approach achieved an average Mean Intersection over Union (mIoU) of 86.24% with an average processing time of just 4 milliseconds per image. When the false-alarm filtering component was incorporated, the system achieved 100% accuracy in detecting cutlines.en_US
dc.language.isoEnglishen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.relation.ispartofIEEE ACCESSen_US
dc.subjectFabricsen_US
dc.subjectReal-time systemsen_US
dc.subjectLightingen_US
dc.subjectDefect detectionen_US
dc.subjectAccuracyen_US
dc.subjectProductionen_US
dc.subjectSemantic segmentationen_US
dc.subjectFeature extractionen_US
dc.subjectTrainingen_US
dc.subjectPrototypesen_US
dc.subjectFabric defect detectionen_US
dc.subjectlocal binary convolutionen_US
dc.subjectcircular knittingen_US
dc.subjectreal-time detectionen_US
dc.subjectfew-sen_US
dc.titleReal-Time Defect Detection for Fast-Moving Fabrics on Circular Knitting Machine Under Various Illumination Conditionsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1109/ACCESS.2025.3593335-
dc.identifier.isiWOS:001550832200015-
dc.relation.journalvolume13en_US
dc.relation.pages139890-139903en_US
item.openairetypejournal article-
item.languageiso639-1English-
item.fulltextno fulltext-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.grantfulltextnone-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Computer Science and Engineering-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
Appears in Collections:資訊工程學系
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