http://scholars.ntou.edu.tw/handle/123456789/4457
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wu Kai | en_US |
dc.contributor.author | Ho, T. H. | en_US |
dc.contributor.author | Jen, I. F. | en_US |
dc.contributor.author | Lee, P. Y. | en_US |
dc.contributor.author | Yang, Y. M. | en_US |
dc.contributor.author | Chin, T. S. | en_US |
dc.date.accessioned | 2020-11-19T00:37:48Z | - |
dc.date.available | 2020-11-19T00:37:48Z | - |
dc.date.issued | 2008-05 | - |
dc.identifier.issn | 0966-9795 | - |
dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/4457 | - |
dc.description.abstract | The oxidation behavior of the (Cu78Y22)98Al2 bulk metallic glass containing ∼55% Cu5Y particles (CYA-composite) was studied over the temperature range of 400–600 °C in dry air. The results generally showed that the oxidation kinetics of the composite obeyed a two-stage parabolic-rate law, with its steady-state parabolic-rate constants (kp values) increased with temperature. In addition, the oxidation rates of the composite were significantly lower than those of the polycrystalline Cu–20%Y alloy. The scales formed on the composite consisted mostly of hexagonal-Y2O3 (h-Y2O3) and minor CuO, while significant amounts of Cu2O and CuO, with minor amounts of Y2O3 were detected for the Cu–20%Y alloy. It was found that the absence of Cu2O is responsible for the slower oxidation rates of CYA-composite. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | Elsevier | en_US |
dc.relation.ispartof | Intermetallics | en_US |
dc.subject | A. Composites | en_US |
dc.subject | B. Oxidation | en_US |
dc.title | Oxidation behavior of the (Cu78Y22)98Al2 bulk metallic glass containing Cu5Y-particle composite at 400–600 °C | en_US |
dc.type | journal article | en_US |
dc.identifier.doi | <Go to ISI>://WOS:000256004700005 | - |
dc.identifier.doi | 10.1016/j.intermet.2008.01.007 | - |
dc.identifier.doi | <Go to ISI>://WOS:000256004700005 | - |
dc.identifier.doi | <Go to ISI>://WOS:000256004700005 | - |
dc.identifier.url | <Go to ISI>://WOS:000256004700005 | |
dc.relation.journalvolume | 16 | en_US |
dc.relation.journalissue | 5 | en_US |
dc.relation.pages | 629-635 | en_US |
item.fulltext | no fulltext | - |
item.cerifentitytype | Publications | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.grantfulltext | none | - |
item.languageiso639-1 | en_US | - |
crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
crisitem.author.dept | Department of Optoelectronics and Materials Technology | - |
crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
crisitem.author.orcid | https://orcid.org/0000-0001-8791-7775 | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
Appears in Collections: | 光電與材料科技學系 |
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