http://scholars.ntou.edu.tw/handle/123456789/4681
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Ren-Kae Shiue | en_US |
dc.contributor.author | Leu-Wen Tsay | en_US |
dc.contributor.author | Chun-Lun Lin | en_US |
dc.contributor.author | Jia-Lin Ou | en_US |
dc.date.accessioned | 2020-11-19T02:23:42Z | - |
dc.date.available | 2020-11-19T02:23:42Z | - |
dc.date.issued | 2003-03 | - |
dc.identifier.issn | 0022-2461 | - |
dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/4681 | - |
dc.description.abstract | Sn-Bi-Ag-(In) solder alloys have been extensively studied in the study. The experimental results reveals that the liquidus temperatures of Sn-(1–5) Bi-(2–3.5)Ag-(0–10)In solders are between 201.7 and 225.3°C, which were higher than that of the most popular eutectic Pb-Sn solder (183°C). Additions of (5–10) wt% In into Sn-Bi-Ag solders can effectively decrease the melting point of the solder alloy. However, the gap between T s and T L temperatures increases with the additions of Bi and In into Sn-Bi-Ag-(In) solders. Although there is no flux applied during soldering, most Sn-Bi-Ag-(In) solder alloys can well bond the Au/Ni metallized copper substrate. 94Sn-3Bi-3Ag solder demonstrates the lowest wetting angle of 45° among all test samples. Thermal expansion coefficients of both 94Sn-3Bi-3Ag and 90Sn-2Bi-3Ag-5In solders are slightly less than that of 63Sn-37Pb. Both 90Sn-2Bi-3Ag-5In/substrate and 94Sn-3Bi-3Ag/substrate interfaces demonstrate similar reaction kinetics in the experiment. The stability of the interface is greatly impaired during 90°C aging. Some locations of the electroless Ni layer break down, and new phases are formed nearby the interface during aging treatment. Initially, the growth of Ni-rich (Ni,Cu)3Sn4 phase dominates the interfacial reaction. However, the growth of Cu-rich (Cu,Ni)6Sn5 phase will dominate the reaction layer for specimens aged at 90°C for long time periods. | en_US |
dc.language.iso | en | en_US |
dc.relation.ispartof | Journal of Materials Science | en_US |
dc.subject | Thermal Expansion | en_US |
dc.subject | Expansion Coefficient | en_US |
dc.subject | Thermal Expansion Coefficient | en_US |
dc.subject | Liquidus Temperature | en_US |
dc.subject | Interfacial Reaction | en_US |
dc.title | A study of Sn-Bi-Ag-(In) lead-free solders | en_US |
dc.type | journal article | en_US |
dc.identifier.doi | 10.1023/a:1022822127193 | - |
dc.identifier.isi | WOS:000181626100021 | - |
dc.relation.journalvolume | 38 | en_US |
dc.relation.journalissue | 6 | en_US |
dc.relation.pages | 1269–1279 | en_US |
item.cerifentitytype | Publications | - |
item.openairetype | journal article | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.languageiso639-1 | en | - |
crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
crisitem.author.dept | Department of Optoelectronics and Materials Technology | - |
crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
crisitem.author.dept | Center of Excellence for Ocean Engineering | - |
crisitem.author.dept | Ocean Energy and Engineering Technology | - |
crisitem.author.orcid | 0000-0003-1644-9745 | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
crisitem.author.parentorg | Center of Excellence for Ocean Engineering | - |
顯示於: | 光電與材料科技學系 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。