http://scholars.ntou.edu.tw/handle/123456789/5515| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Liao, C. C. | en_US |
| dc.contributor.author | Cheng-Fa Cheng | en_US |
| dc.contributor.author | Yu, D. S. | en_US |
| dc.contributor.author | Chin, A. | en_US |
| dc.date.accessioned | 2020-11-19T10:38:45Z | - |
| dc.date.available | 2020-11-19T10:38:45Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.issn | 0013-4651 | - |
| dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/5515 | - |
| dc.relation.ispartof | Journal of the Electrochemical Society | en_US |
| dc.title | The copper contamination effect of Al2O3 gate dielectric on Si | en_US |
| dc.type | journal article | en_US |
| dc.identifier.doi | 10.1149/1.1789391 | - |
| dc.identifier.doi | <Go to ISI>://WOS:000224678500073 | - |
| dc.identifier.url | <Go to ISI>://WOS:000224678500073 | |
| dc.relation.journalvolume | 151 | en_US |
| dc.relation.journalissue | 10 | en_US |
| item.cerifentitytype | Publications | - |
| item.openairetype | journal article | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.fulltext | no fulltext | - |
| item.grantfulltext | none | - |
| crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
| crisitem.author.dept | Department of Communications, Navigation and Control Engineering | - |
| crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| Appears in Collections: | 通訊與導航工程學系 | |
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