http://scholars.ntou.edu.tw/handle/123456789/8744| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chen, T. P. | en_US |
| dc.contributor.author | Lee, C. J. | en_US |
| dc.contributor.author | Wen-Shiung Lour | en_US |
| dc.contributor.author | Guo, D. F. | en_US |
| dc.contributor.author | Tsai, J. H. | en_US |
| dc.contributor.author | Liu, W. C. | en_US |
| dc.date.accessioned | 2020-11-20T11:28:22Z | - |
| dc.date.available | 2020-11-20T11:28:22Z | - |
| dc.date.issued | 2009-02 | - |
| dc.identifier.issn | 0038-1101 | - |
| dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/8744 | - |
| dc.relation.ispartof | Solid-State Electronics | en_US |
| dc.title | On the breakdown behaviors of InP/InGaAs based heterojunction bipolar transistors (HBTs) | en_US |
| dc.type | journal article | en_US |
| dc.identifier.doi | 10.1016/j.sse.2008.11.003 | - |
| dc.identifier.doi | <Go to ISI>://WOS:000263596100016 | - |
| dc.identifier.url | <Go to ISI>://WOS:000263596100016 | |
| dc.relation.journalvolume | 53 | en_US |
| dc.relation.journalissue | 2 | en_US |
| item.cerifentitytype | Publications | - |
| item.openairetype | journal article | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.fulltext | no fulltext | - |
| item.grantfulltext | none | - |
| crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
| crisitem.author.dept | Department of Electrical Engineering | - |
| crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| Appears in Collections: | 電機工程學系 | |
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