| 公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
|---|---|---|---|---|---|---|
| 2024/3/26 | Detecting Low-Yield Machines in Batch Production Systems Based on Observed Defective Pieces | Adipraja, Philip F. E.; Chang, Chin-Chun ; Yang, Hua-Sheng; Wang, Wei-Jen; Liang, Deron | IEEE TRANSACTIONS ON SYSTEMS MAN CYBERNETICS-SYSTEMS | |||
| 2022 | Prediction of per-batch yield rates in production based on maximum likelihood estimation of per-machine yield rates | Adipraja, Philip F. E.; Chang, Chin-Chun ; Wang, Wei-Jen; Liang, Deron | JOURNAL OF MANUFACTURING SYSTEMS | 0 |
