| 公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
|---|---|---|---|---|---|---|
| 2020 | Experimental analysis of interfacial shear stress and electrical resistance of indium tin oxide-coated polyethylene terephthalate films for a whole folding test | Bor-Jiunn Wen ; Huang, S. A.; Tseng, T. Y. | Journal of Plastic Film & Sheeting | 2 | ||
| 2019 | Residual Stress Image Inspections Based on Bending Testing for Flexible Transparent Conducting Substrates by Single-Direction Common-Path Image Interferometry | Bor-Jiunn Wen ; Huang, S. A. | Ieee Sensors Journal | 3 |
