| 公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
|---|---|---|---|---|---|---|
| 2010 | A TEM investigation of retained defects in Si wafer by 1 MeV Si ions bombardment | Hsu, J. Y.; Rong-Tan Huang ; Hung, M. J.; Yu, Y. C. | Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms |
