| 公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
|---|---|---|---|---|---|---|
| 2014 | Modeling and Controller Design of a Precision Hybrid Scanner for Application in Large Measurement-Range Atomic Force Microscopy | Jim-Wei Wu; Kuan-Chia Huang; Ming-Li Chiang ; Mei-Yung Chen; Li-Chen Fu | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | 32 |
