| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2004 | Fatigue crack growth behavior of laser-annealed IN 718 alloy in hydrogen | L.W. Tsay ; H.H. Lin; R.K.Shiue | ||||
| 2003 | The reliability study of selected Sn-Zn based lead-free solders on Au Ni-P Cu substrate | R.K.Shiue; L.W. Tsay ; C.L. Lin; J.L. Ou | Microelectronics Reliability | 36 |
