| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2010 | Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation | Shiu, J. Y.; Lu, C. Y.; Su, T. Y.; Rong-Tan Huang ; Zirath, H.; Rorsman, N.; Chang, E. Y. | Japanese Journal of Applied Physics |
