| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 1997 | Deep traps and mechanism of brightness degradation in Mn-doped ZnS thin-film electroluminescent devices grown by metal-organic chemical vapor deposition | Wang, C. W.; Terng-Ji Sheu ; Su, Y. K.; Yokoyama, M. | Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers |
