| 2011 | Experimental investigation of the reliability issue of RRAM based on high resistance state conduction | Zhang, L. J.; Hsu, Y. Y.; Chen, F. T.; Lee, H. Y.; Chen, Y. S.; Chen, W. S.; Gu, P. Y.; Liu, W. H.; Wang, S. M.; Chen-Han Tsai ; Huang, R.; Tsai, M. J. | Nanotechnology | | | |
| 2011 | Resistance switching for RRAM applications | Chen, F. T.; Lee, H.; Chen, Y. S.; Hsu, Y. Y.; Zhang, L. J.; Chen, P. S.; Chen, W. S.; Gu, P. Y.; Liu, W. H.; Wang, S. M.; Chen-Han Tsai ; Sheu, S.; Tsai, M. J.; Huang, R. | Science China-Information Sciences | | | |
