| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2024/3/26 | Detecting Low-Yield Machines in Batch Production Systems Based on Observed Defective Pieces | Adipraja, Philip F. E.; Chang, Chin-Chun ; Yang, Hua-Sheng; Wang, Wei-Jen; Liang, Deron | IEEE TRANSACTIONS ON SYSTEMS MAN CYBERNETICS-SYSTEMS |
