Issue Date | Title | Author(s) | Source | WOS | Fulltext/Archive link |
---|---|---|---|---|---|
2009 | The optical constants of thin films calculated from reflectance and transmittance measurements | D. Chiang; C. H. Chu; H. -P. Chiang ; D. P. Tsai | |||
2009 | Phase-change masking for nanolithography | C. H. Chu; C. D. Shiue; H. W. Chen; B. H. Chen; D. Chiang; H. -P. Chiang ; D. P. Tsai |