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Showing results 113 to 132 of 190 < previous   next >
Issue DateTitleAuthor(s)SourcescopusWOSFulltext/Archive link
2012Photoluminescence and Raman scattering characterization of Cu(2)ZnSiQ(4) (Q= S, Se) single crystalsLevcenco, S.; Dumcenco, D. O.; Wang, Y. P.; Wu, J. D.; Huang, Y. S.; Arushanov, E.; Tezlevan, V.; Kwong-Kau Tiong Optical Materials27
2010Photoluminescence and surface photovoltage spectroscopy characterization of highly strained In GaAs/GaAs quantum well structures grown by metal organic vapor phase epitaxyChan, C. H.; Wu, J. D.; Huang, Y. S.; Hsu, H. P.; Kwong-Kau Tiong ; Sue, Y. K.Materials Chemistry and Physics6
2008Photoluminescence and surface photovoltage spectroscopy characterization of Zn1-x-yBexMgySe mixed crystalsDumcenco, D. O.; Hsu, H. P.; Huang, Y. S.; Firszt, F.; Legowski, S.; Meczynska, H.; Strzalkowski, K.; Kwong-Kau Tiong Journal of Applied Physics
2013Photoluminescence characterization of GaAs/GaAs0.64P0.19 Sb-0.17/GaAs heterostructureChen, J. Y.; Chen, B. H.; Huang, Y. S.; Chin, Y. C.; Tsai, H. S.; Lin, H. H.; Kwong-Kau Tiong Journal of Luminescence5
2012Photoluminescence characterization of vertically aligned ZnO microrodsDumcenco, D. O.; Huang, Y. S.; Kuo, D. H.; Kwong-Kau Tiong Journal of Luminescence13
2016Photoluminescence of localized excitons in ZnCdO thin films grown by molecular beam epitaxyWu, T. Y.; Huang, Y. S.; Hu, S. Y.; Lee, Y. C.; Kwong-Kau Tiong ; Chang, C. C.; Shen, J. L.; Chou, W. C.Solid State Communications6
2017Photoluminescence properties of MgxZn1-xO films grown by molecular beam epitaxyWu, T. Y.; Huang, Y. S.; Hu, S. Y.; Lee, Y. C.; Kwong-Kau Tiong ; Chang, C. C.; Chou, W. C.; Shen, J. L.Journal of Crystal Growth3
2013Photoreflectance Spectroscopy Characterization of Ge/Si0.16Ge0.84 Multiple Quantum Wells on Ge Virtual SubstrateHsu, H. P.; Yang, P. H.; Huang, J. K.; Wu, P. H.; Huang, Y. S.; Li, C.; Huang, S. H.; Kwong-Kau Tiong Advances in Condensed Matter Physics2
2012Photoreflectance study of direct-gap interband transitions in Ge/SiGe multiple quantum wells with Ge-rich barriersHsu, H. P.; Wu, P. H.; Huang, Y. S.; Chrastina, D.; Isella, G.; von Kanel, H.; Kwong-Kau Tiong Applied Physics Letters3
2009Piezoreflectance and photoreflectance study of annealing effects on GaAs0.916Sb0.084 and GaAs0.906Sb0.075N0.019 films on GaAs grown by gas-source molecular beam epitaxyHsu, H. P.; Huang, Y. N.; Huang, Y. S.; Lin, Y. T.; Ma, T. C.; Lin, H. H.; Kwong-Kau Tiong ; Sitarek, P.; Misiewicz, J.Physica Status Solidi a-Applications and Materials Science
2000Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline filmHsieh, C. H.; Huang, Y. S.; Kwong-Kau Tiong ; Fan, C. W.; Chen, Y. F.; Chen, L. C.; Wu, J. J.; Chen, K. H.Journal of Applied Physics6
1998Piezoreflectance study of band-edge excitons of ReS2-xSex single crystalsHo, C. H.; Huang, Y. S.; Liao, P. C.; Kwong-Kau Tiong Physical Review B16
1996Piezoreflectance study of InP near the absorption edgeChung, S. Y.; Lin, D. Y.; Huang, Y. S.; Kwong-Kau Tiong Semiconductor Science and Technology
2014Piezoreflectance study of near band edge excitonic-transitions of mixed-layered crystal Mo(SxSe1-x)(2) solid solutionsWu, Y. J.; Wu, P. H.; Jadczak, J.; Huang, Y. S.; Ho, C. H.; Hsu, H. P.; Kwong-Kau Tiong Journal of Applied Physics17
2000Piezoreflectance study of silicon carbon nitride nanorodsHsieh, C. H.; Huang, Y. S.; Kuo, P. F.; Chen, Y. F.; Chen, L. C.; Wu, J. J.; Chen, K. H.; Kwong-Kau Tiong Applied Physics Letters12
1997Piezoreflectance study of the band-edge excitons of ReS2Ho, C. H.; Liao, P. C.; Huang, Y. S.; Kwong-Kau Tiong Solid State Communications
2011Polarization Dependent Raman Active Modes Study of the Mo1-xWxS2 Mixed Layered CrystalsDumcenco, D. O.; Su, Y. C.; Wang, Y. P.; Chen, K. Y.; Huang, Y. S.; Ho, C. H.; Kwong-Kau Tiong Chinese Journal of Physics
2011Polarization-dependent electrolyte electroreflectance study of Cu2ZnSiS4 and Cu2ZnSiSe4 single crystalsLevcenco, S.; Dumcenco, D.; Huang, Y. S.; Arushanov, E.; Tezlevan, V.; Kwong-Kau Tiong ; Du, C. H.Journal of Alloys and Compounds40
2001Polarized electrolyte-electroreflectance study of ReS2 and ReSe2 layered semiconductorsHo, C. H.; Yen, P. C.; Huang, Y. S.; Kwong-Kau Tiong Journal of Physics-Condensed Matter14
2001Polarized-photoreflectance characterization of an InGaP/InGaAsN/GaAs NpN double-heterojunction bipolar transistor structureLin, C. J.; Huang, Y. S.; Li, N. Y.; Li, P. W.; Kwong-Kau Tiong Journal of Applied Physics7
Showing results 113 to 132 of 190 < previous   next >
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