| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
| 1997 | Characterization of IrO2 thin films by Raman spectroscopy | Liao, P. C.; Chen, C. S.; Ho, W. S.; Huang, Y. S.; Kwong-Kau Tiong | Thin Solid Films | | | |
| 1996 | Characterization of RuO2 thin films deposited on Si by metal-organic chemical vapor deposition | Liao, P. C.; Mar, S. Y.; Ho, W. S.; Huang, Y. S.; Kwong-Kau Tiong | Thin Solid Films | | | |
| 1998 | Characterization of sputtered iridium dioxide thin films | Liao, P. C.; Ho, W. S.; Huang, Y. S.; Kwong-Kau Tiong | Journal of Materials Research | | | |
