公開日期 | 標題 | 作者 | 來源出版物 | WOS | 全文 |
2002 | Angle-dependent differential-photovoltage spectroscopy for the characterization of a GaAs/GaAlAs based vertical-cavity surface-emitting laser structure | Wang, S. D.; Liang, J. S.; Huang, Y. S.; Tien, C. W.; Chang, Y. M.; Chen, C. W.; Li, N. Y.; Kwong-Kau Tiong ; Pollak, F. H. | Journal of Applied Physics | 7 | |
2001 | Polarized-photoreflectance characterization of an InGaP/InGaAsN/GaAs NpN double-heterojunction bipolar transistor structure | Lin, C. J.; Huang, Y. S.; Li, N. Y.; Li, P. W.; Kwong-Kau Tiong | Journal of Applied Physics | 7 | |
2003 | Surface photovoltage spectroscopy as a valuable nondestructive characterization technique for GaAs/GaAlAs vertical-cavity surface-emitting laser structures | Liang, J. S.; Wang, S. D.; Huang, Y. S.; Tien, C. W.; Chang, Y. M.; Chen, C. W.; Li, N. Y.; Kwong-Kau Tiong ; Pollak, F. H. | Journal of Physics-Condensed Matter | 11 | |