| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2006 | Demonstrating applications of non-optically regulated tapping-mode near-field scanning optical microscopy to nano-optical metrology and optical characterization of semiconductors | Nien Hua Lu; Shuen De Chang; Guan-Bin Huang; Hung Ji Huang; Ying Sheng Huang; Hai-Pang Chiang ; Din Ping Tsai | Japanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers | 2 |
