第 1 到 3 筆結果，共 3 筆。
| 公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 | |
|---|---|---|---|---|---|---|---|
| 1 | 2006 | Optimization of component placement scheduling for SMT assemblies | Kuo, C. H.; Mu-Der Jeng ; Wing, J. J.; Wang, T. H. | Progress on Advanced Manufacture for Micro/Nano Technology 2005, Pt 1 and 2 | |||
| 2 | 2006 | An intelligent technique based on Petri nets for diagnosability enhancement of discrete event systems | Wen, Y. L.; Mu-Der Jeng ; Jeng, L. D.; Fan, P. S. | Knowledge-Based Intelligent Information and Engineering Systems, Pt 2, Proceedings | |||
| 3 | 2006 | Diagnosability of semiconductor manufacturing equipment | Wen, Y. L.; Mu-Der Jeng ; Huang, Y. S. | Progress on Advanced Manufacture for Micro/Nano Technology 2005, Pt 1 and 2 |
