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  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 電機工程學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/17017
DC 欄位值語言
dc.contributor.authorChun-Shun Tsengen_US
dc.contributor.authorKai-Tse Wangen_US
dc.contributor.authorMing-Chang Wuen_US
dc.contributor.authorNai-Yuan Chengen_US
dc.contributor.authorJung-Hua Wangen_US
dc.date.accessioned2021-06-04T05:47:24Z-
dc.date.available2021-06-04T05:47:24Z-
dc.date.issued2010-07-13-
dc.identifier.isbn978-1-4244-7298-7-
dc.identifier.issn1935-4576-
dc.identifier.urihttps://ieeexplore.ieee.org/document/5549451-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/17017-
dc.description.abstractA novel method for fast reading barcodes commonly encountered in industrial applications is presented. The method mainly consists of two stages: (1) a process characterizing in cross scanning an overly downscaled image to extract candidate barcode skeletons is used to locate barcodes in an image, wherein at least one skeleton is extracted from the downscaled binary image; coordinates of at least one point of each skeleton are enlarged back to their original resolution and used as center points of plural detection windows in the original image plane. (2) a Sobel-based grading scheme is employed to determine wining detection windows for reading barcodes, wherein a retrospective tracking mechanism is proposed to deal with warped, slanted or even stained barcodes. Since the center points of the wining detection windows are directly treated as sampling points of the barcodes, pixel by pixel search is dispensable and computation time can be greatly reduced.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectImage resolutionen_US
dc.subjectMobile handsetsen_US
dc.subjectCamerasen_US
dc.subjectskeletonemaen_US
dc.subjectManufacturing automationen_US
dc.subjectdecodingen_US
dc.subjectLayouten_US
dc.subjectApplication softwareen_US
dc.subjectdata miningen_US
dc.subjectShapeen_US
dc.titleRetrospective tracking for barcode readingen_US
dc.typeconference paperen_US
dc.relation.conference2010 8th IEEE International Conference on Industrial Informaticsen_US
dc.relation.conferenceOsaka, Japanen_US
dc.identifier.doi10.1109/INDIN.2010.5549451-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.cerifentitytypePublications-
item.openairetypeconference paper-
item.languageiso639-1en-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Electrical Engineering-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
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