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請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/17086
DC 欄位值語言
dc.contributor.authorJ.-H. Wangen_US
dc.contributor.authorT.F. Krileen_US
dc.contributor.authorJ.F. Walkupen_US
dc.date.accessioned2021-06-09T07:18:44Z-
dc.date.available2021-06-09T07:18:44Z-
dc.date.issued1990-06-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/17086-
dc.description.abstractStatistical parameters that can be used to estimate the convergence probability of arbitrary-order Hebbian-type neural network associative memories (HAMs) with N neurons and M stored patterns are developed. The principle involves using two figures of merit, ε/η and η N , to determine the convergence probability for indirect (iterative) convergence and direct (one-step) convergence HAMs. Given η, the probability that a neuron changes to an incorrect bit after one update, the parameter ε/η determines the capability of converging iteratively to at most ε N bits away from the stored vector after a stable state is reached, where 0<ε<0.5. It is shown that the indirect convergence probability P ic ≈1.0 for all HAMs having ε/η>20. If precise convergence to the stored vector is required in one step, the parameter η N is used to determine the probability of direct convergence, P dcen_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.titleFigures of merit for the performance of Hebbian-type associative memoriesen_US
dc.typeconference paperen_US
dc.relation.conference1990 IJCNN International Joint Conference on Neural Networksen_US
dc.relation.conferenceSan Diego, CA, USAen_US
dc.identifier.doi10.1109/IJCNN.1990.137674-
item.openairecristypehttp://purl.org/coar/resource_type/c_5794-
item.cerifentitytypePublications-
item.languageiso639-1en-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairetypeconference paper-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Electrical Engineering-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
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