http://scholars.ntou.edu.tw/handle/123456789/1848| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ru-Jing Sun | en_US |
| dc.contributor.author | Hung Ji Huang | en_US |
| dc.contributor.author | Chien-Nan Hsiao | en_US |
| dc.contributor.author | Yu-Wei Lin | en_US |
| dc.contributor.author | Bo-Huei Liao | en_US |
| dc.contributor.author | Yuan-Fong Chou Chau | en_US |
| dc.contributor.author | Hai-Pang Chiang | en_US |
| dc.contributor.author | Hai-Pang Chiang | en_US |
| dc.date.accessioned | 2020-11-17T01:11:22Z | - |
| dc.date.available | 2020-11-17T01:11:22Z | - |
| dc.date.issued | 2020-07-06 | - |
| dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/1848 | - |
| dc.description.abstract | A TiN-based substrate with high reusability presented high-sensitivity refractive index measurements in a home-built surface plasmon resonance (SPR) heterodyne phase interrogation system. TiN layers with and without additional inclined-deposited TiN (i-TiN) layers on glass substrates reached high bulk charge carrier densities of 1.28 × 1022 and 1.91 × 1022 cm−3, respectively. The additional 1.4 nm i-TiN layer of the nanorod array presented a detection limit of 6.1 × 10−7 RIU and was higher than that of the 46 nm TiN layer at 1.2 × 10−6 RIU when measuring the refractive index of a glucose solution. Furthermore, the long-term durability of the TiN-based substrate demonstrated by multiple processing experiments presented a high potential for various practical sensing applications. | en_US |
| dc.language.iso | en | en_US |
| dc.relation.ispartof | Nanomaterials | en_US |
| dc.subject | refractive index | en_US |
| dc.subject | glucose solution | en_US |
| dc.subject | charge carrier density | en_US |
| dc.subject | surface plasmon resonance | en_US |
| dc.subject | heterodyne phase interrogation | en_US |
| dc.subject | sensitivities | en_US |
| dc.subject | long-term durability | en_US |
| dc.subject | TiN layer | en_US |
| dc.title | Reusable TiN Substrate for Surface Plasmon Resonance Heterodyne Phase Interrogation Sensor | en_US |
| dc.type | journal article | en_US |
| dc.identifier.doi | 10.3390/nano10071325 | - |
| dc.identifier.isi | 000557566600001 | - |
| dc.relation.journalvolume | 10 | en_US |
| dc.relation.journalissue | 7 | en_US |
| dc.relation.pages | 1325 | en_US |
| item.openairetype | journal article | - |
| item.fulltext | no fulltext | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.grantfulltext | none | - |
| item.cerifentitytype | Publications | - |
| item.languageiso639-1 | en | - |
| crisitem.author.dept | College of Electrical Engineering and Computer Science | - |
| crisitem.author.dept | Department of Optoelectronics and Materials Technology | - |
| crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
| crisitem.author.orcid | 0000-0003-0752-175X | - |
| crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| Appears in Collections: | 光電與材料科技學系 | |
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