Local oxidation of InN and GaN using an atomic force microscope

Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/2012

Title:	Local oxidation of InN and GaN using an atomic force microscope
Authors:	Hu, Z. S. You, Z. Y. Tai-Yuan Lin Hsiao, C. L. Tu, L. W. Jih-Shang Hwang
Issue Date:	Feb-2006
Journal Volume:	17
Journal Issue:	3
Source:	Nanotechnology
URI:	http://scholars.ntou.edu.tw/handle/123456789/2012
ISSN:	0957-4484
DOI:	10.1088/0957-4484/17/3/041 ://WOS:000235641000041
Appears in Collections:	光電與材料科技學系

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