Skip navigation
  • 中文
  • English

DSpace CRIS

  • DSpace logo
  • Home
  • Research Outputs
  • Researchers
  • Organizations
  • Projects
  • Explore by
    • Research Outputs
    • Researchers
    • Organizations
    • Projects
  • Communities & Collections
  • SDGs
  • Sign in
  • 中文
  • English
  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/20161
DC FieldValueLanguage
dc.contributor.authorChen, Yung-, Ien_US
dc.contributor.authorChen, Chun-Yenen_US
dc.contributor.authorChang, Li-Chunen_US
dc.contributor.authorKai, Wuen_US
dc.date.accessioned2022-02-10T02:50:41Z-
dc.date.available2022-02-10T02:50:41Z-
dc.date.issued2021-11-01-
dc.identifier.issn2238-7854-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/20161-
dc.description.abstractIn this study, NbTaMoW medium-entropy alloy films were prepared using a cosputtering apparatus with four sputter guns. Pure-element targets were used for sputtering. The rotational speeds of the substrate holder (R-S) were 1-30 rpm. Lower R-S values resulted in the formed films exhibiting a multilayer stacked structure with a cyclical gradient concentration. The crystalline phases, mechanical properties, and oxidation behavior of the prepared NbTaMoW films were investigated. The uniformity of the prepared multilayered alloy films increased with the RS value. The monolithic NbTaMoW alloy films prepared at 30 rpm exhibited a single body-centered cubic (BCC) phase, hardness of 12.9 GPa, and Young's modulus of 278 GPa. The BCC phase evolved into a combination of multiple BCC phases when R-S was <10 rpm. The multilayered NbTaMoW alloy films prepared at 10 rpm exhibited high hardness of 14.1 GPa and a comparable Young's modulus of 274 GPa. The prepared NbTaMoW films exhibited activation energy of 104 kJ/mol at 350-600 degrees C in air, and MoO3 was volatilized at temperatures of >= 550 degrees C. The monolithic and multilayered NbTaMoW films with a thickness of approximately 1240 nm were completely oxidized after annealing at 600 degrees C for 2 h. (c) 2021 The Author(s). Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/).en_US
dc.language.isoEnglishen_US
dc.publisherELSEVIERen_US
dc.relation.ispartofJOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&Ten_US
dc.subjectHigh-entropy alloyen_US
dc.subjectMedium-entropy alloy filmen_US
dc.subjectMechanical propertyen_US
dc.subjectMultilayered filmen_US
dc.subjectOxidation behavioren_US
dc.titleCharacterization of cosputtered NbTaMoW filmsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1016/j.jmrt.2021.08.093-
dc.identifier.isiWOS:000734203700005-
dc.relation.journalvolume15en_US
dc.relation.pages1090-1099en_US
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.languageiso639-1English-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairetypejournal article-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.orcid0000-0003-0689-5709-
crisitem.author.orcidhttps://orcid.org/0000-0001-8791-7775-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
Appears in Collections:光電與材料科技學系
Show simple item record

WEB OF SCIENCETM
Citations

3
Last Week
0
Last month
0
checked on Jun 27, 2023

Page view(s)

182
Last Week
0
Last month
2
checked on Jun 30, 2025

Google ScholarTM

Check

Altmetric

Altmetric

Related Items in TAIR


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Explore by
  • Communities & Collections
  • Research Outputs
  • Researchers
  • Organizations
  • Projects
Build with DSpace-CRIS - Extension maintained and optimized by Logo 4SCIENCE Feedback