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  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 電機工程學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/21435
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dc.contributor.authorJian-Hong Liuen_US
dc.contributor.authorChia-Chi Chuen_US
dc.date.accessioned2022-04-19T05:49:39Z-
dc.date.available2022-04-19T05:49:39Z-
dc.date.issued2014-03-
dc.identifier.issn0885-8950-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/21435-
dc.description.abstractThe coupled single-port model has been proposed recently for wide-area measurement-based voltage stability assessment. This concept relies in decoupling a mesh power grid into the local single-port circuit coupled with an extra impedance. However, underestimations in this approach have been observed in simulation studies. In this paper, a modified coupled single-port model is proposed. Based on real-time PMU measurements of individual load bus, the reactive power response used in the extended Ward-type equivalent will be explored to compensate the reactive power mismatch in the existing model. In addition, a mitigation factor is introduced to modify the Thevenin equivalent parameter of the existing model. Due to the simplicity of the proposed model, several voltage stability indicators can be applied with slight modifications. Simulations on various IEEE test systems are presented to validate the accuracy of the proposed method.en_US
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.relation.ispartofTransactions on Power Systemsen_US
dc.subjectLoad modelingen_US
dc.subjectVoltage measurementen_US
dc.subjectImpedanceen_US
dc.subjectIntegrated circuit modelingen_US
dc.subjectPower system stabilityen_US
dc.subjectPhasor measurement unitsen_US
dc.subjectReactive poweren_US
dc.subjectCoupled single-port circuiten_US
dc.subjectextended ward equivalenten_US
dc.subjectmaximal loading parameteren_US
dc.subjectmaximum power transferen_US
dc.subjectreactive power responseen_US
dc.subjectvoltage stabilityen_US
dc.titleWide-Area Measurement-Based Voltage Stability Indicators by Modified Coupled Single-Port Modelsen_US
dc.typejournal articleen_US
dc.identifier.doi10.1109/TPWRS.2013.2284475-
dc.identifier.isiWOS:000331978000024-
dc.relation.journalvolume29en_US
dc.relation.journalissue2en_US
dc.relation.pages756-764en_US
dc.identifier.eissn1558-0679en_US
item.openairetypejournal article-
item.fulltextno fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.languageiso639-1en_US-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptDepartment of Electrical Engineering-
crisitem.author.deptCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
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