http://scholars.ntou.edu.tw/handle/123456789/2230| Title: | Structural characterization of sputter-deposited Ba0.48Sr0.52TiO3/LaNiO3 artificial superlattice structure by X-ray reflectivity and diffraction | Authors: | Lee, H. Y. Wu, K. F. Liu, H. J. Lee, C. H. Yuan-Chang Liang |
Issue Date: | Nov-2006 | Journal Volume: | 515 | Journal Issue: | 3 | Source: | Thin Solid Films | URI: | http://scholars.ntou.edu.tw/handle/123456789/2230 | ISSN: | 0040-6090 | DOI: | 10.1016/j.tsf.2006.07.043 |
| Appears in Collections: | 光電與材料科技學系 |
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