Skip navigation
  • 中文
  • English

DSpace CRIS

  • DSpace logo
  • 首頁
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
  • 分類瀏覽
    • 研究成果檢索
    • 研究人員
    • 單位
    • 計畫
  • 機構典藏
  • SDGs
  • 登入
  • 中文
  • English
  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/22451
標題: Generating High-Order Transverse Patterns in Optically Pumped Semiconductor Lasers
作者: Tuan, Pi-Hui
Hsieh, Yen-Hui
Tu, Chin-Wei
Lee, Chi-Chun
Tsou, Chia-Han
Liang, Hsin-Chih 
Huang, Kai-Feng
Chen, Yung-Fu
關鍵字: Vertical emitting lasers;semiconductor lasers;laser beam characterization;optical vortices
公開日期: 1-十一月-2019
出版社: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
卷: 25
期: 6
來源出版物: IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
摘要: 
High-order pattern formation in an optically pumped semiconductor laser (OPSL) under a selective pumping with varying spatial overlap between the pump beam and transverse modes is explored. In contrast to transverse pattern generation by off-axis pumped solid-state lasers where the mode order can be flexibly increased, experimental results reveal that the selective pumping fails to realize high-order mode operation in OPSLs when the pump-to-mode size ratio and pump power are insufficiently large. On the other hand, several high-order patterns belonging to the Hermite-Laguerre-Gaussian (HLG) modes are observed when scanning a large-ratio pump beam to specific positions on the gain chip. These HLG modes are experimentally confirmed to mainly originate from the transverse non-uniformity of present OPSL chip, while their structural features cannot be simply correlated with the pump scanning positions. Nevertheless, it is believed that the first-time observation of pure HLG modes under the large-ratio pumping can offer useful insights into the high-order pattern manipulation in OPSLs.
URI: http://scholars.ntou.edu.tw/handle/123456789/22451
ISSN: 1077-260X
DOI: 10.1109/JSTQE.2019.2921380
顯示於:光電與材料科技學系

顯示文件完整紀錄

WEB OF SCIENCETM
Citations

1
上周
0
上個月
checked on 2023/6/27

Page view(s)

100
checked on 2025/6/30

Google ScholarTM

檢查

Altmetric

Altmetric

TAIR相關文章


在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。

瀏覽
  • 機構典藏
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
DSpace-CRIS Software Copyright © 2002-  Duraspace   4science - Extension maintained and optimized by NTU Library Logo 4SCIENCE 回饋