Skip navigation
  • 中文
  • English

DSpace CRIS

  • DSpace logo
  • 首頁
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
  • 分類瀏覽
    • 研究成果檢索
    • 研究人員
    • 單位
    • 計畫
  • 機構典藏
  • SDGs
  • 登入
  • 中文
  • English
  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
Please use this identifier to cite or link to this item: http://scholars.ntou.edu.tw/handle/123456789/22749
標題: Probing Surface Band Bending of Surface-Engineered Metal Oxide Nanowires
作者: Cheng-Ying Chen 
Jose Ramon Duran Retamal
I-Wen Wu
Der-Hsien Lien
Ming-Wei Chen
Yong Ding
Yu-Lun Chueh
Chih-I Wu
Jr-Hau He
關鍵字: ZNO NANOWIRE;N-TYPE;SCHOTTKY CONTACTS;ELECTRICAL-PROPERTIES;SNO2 NANOWIRES;WORK FUNCTION;PHOTODETECTORS;SEMICONDUCTOR;ENHANCEMENT;SENSORS
公開日期: 十月-2012
出版社: American Chemical Society
卷: 6
期: 11
起(迄)頁: 9366-9372
來源出版物: ACS nano
摘要: 
We in situ probed the surface band bending (SBB) by ultraviolet photoelectron spectroscopy (UPS) in conjunction with field-effect transistor measurements on the incompletely depleted ZnO nanowires (NWs). The diameter range of the NWs is ca. 150–350 nm. Several surface treatments (i.e., heat treatments and Au nanoparticle (NP) decoration) were conducted to assess the impact of the oxygen adsorbates on the SBB. A 100 °C heat treatment leads to the decrease of the SBB to 0.74 ± 0.15 eV with 29.9 ± 3.0 nm width, which is attributed to the removal of most adsorbed oxygen molecules from the ZnO NW surfaces. The SBB of the oxygen-adsorbed ZnO NWs is measured to be 1.53 ± 0.15 eV with 43.2 ± 2.0 nm width. The attachment of Au NPs to the NW surface causes unusually high SBB (2.34 ± 0.15 eV with the wide width of 53.3 ± 1.6 nm) by creating open-circuit nano-Schottky junctions and catalytically …
URI: http://scholars.ntou.edu.tw/handle/123456789/22749
ISSN: 1936-0851
DOI: 10.1021/nn205097e
顯示於:光電與材料科技學系

顯示文件完整紀錄

WEB OF SCIENCETM
Citations

140
上周
1
上個月
checked on 2023/6/27

Page view(s)

118
checked on 2025/6/30

Google ScholarTM

檢查

Altmetric

Altmetric

TAIR相關文章


在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。

瀏覽
  • 機構典藏
  • 研究成果檢索
  • 研究人員
  • 單位
  • 計畫
DSpace-CRIS Software Copyright © 2002-  Duraspace   4science - Extension maintained and optimized by NTU Library Logo 4SCIENCE 回饋