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  1. National Taiwan Ocean University Research Hub
  2. 電機資訊學院
  3. 光電與材料科技學系
請用此 Handle URI 來引用此文件: http://scholars.ntou.edu.tw/handle/123456789/22989
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dc.contributor.authorJH Heen_US
dc.contributor.authorPH Changen_US
dc.contributor.authorCheng-Ying Chenen_US
dc.contributor.authorKT Tsaien_US
dc.date.accessioned2022-11-07T02:21:56Z-
dc.date.available2022-11-07T02:21:56Z-
dc.date.issued2009-04-
dc.identifier.issn0957-4484-
dc.identifier.urihttp://scholars.ntou.edu.tw/handle/123456789/22989-
dc.description.abstractWe report on the transport properties of a single ZnO nanowire (NW) measured as a function of the length/square of the radius ratio via the transmission line method (TLM). The specific contact resistance of FIB-Pt contacts to the ZnO NWs is determined to be as low as 1.1 × 10−5 Ω cm2. The resistivity of the ZnO NWs is measured to be 2.2 × 10−2 Ω cm. ZnO NW-based UV photodetectors contacted by FIB-Pt with a photoconductive gain as high as ∼108 have been fabricated and characterized.en_US
dc.language.isoen_USen_US
dc.publisherIOP Publishingen_US
dc.relation.ispartofNANOTECHNOLOGYen_US
dc.titleElectrical and optoelectronic characterization of a ZnO nanowire contacted by focused-ion-beam-deposited Pten_US
dc.typejournal articleen_US
dc.identifier.doi10.1088/0957-4484/20/13/135701-
dc.identifier.isi000264093800026-
dc.relation.journalvolume20en_US
dc.relation.journalissue13en_US
dc.relation.pages135701en_US
dc.identifier.eissn1361-6528en_US
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.languageiso639-1en_US-
item.fulltextno fulltext-
item.grantfulltextnone-
item.openairetypejournal article-
crisitem.author.deptNational Taiwan Ocean University,NTOU-
crisitem.author.deptCollege of Engineering-
crisitem.author.deptDepartment of Optoelectronics and Materials Technology-
crisitem.author.parentorgNational Taiwan Ocean University,NTOU-
crisitem.author.parentorgCollege of Electrical Engineering and Computer Science-
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