http://scholars.ntou.edu.tw/handle/123456789/23004| DC 欄位 | 值 | 語言 |
|---|---|---|
| dc.contributor.author | Cheng-Ying Chen | en_US |
| dc.contributor.author | Ming-Wei Chen | en_US |
| dc.contributor.author | Chia-Yang Hsu | en_US |
| dc.contributor.author | Der-Hsien Lien | en_US |
| dc.contributor.author | Miin-Jang Chen | en_US |
| dc.contributor.author | Hau He | en_US |
| dc.date.accessioned | 2022-11-07T07:17:05Z | - |
| dc.date.available | 2022-11-07T07:17:05Z | - |
| dc.date.issued | 2012-11 | - |
| dc.identifier.issn | 1077-260X | - |
| dc.identifier.uri | http://scholars.ntou.edu.tw/handle/123456789/23004 | - |
| dc.description.abstract | ZnO nanowire (NW) UV photodetectors (PDs) have high sensitivity, while their long recovery time is an important limitation for practical applications. We demonstrated that the recovery time of nanostructured ZnO PDs can be significantly improved using the nanobelt (NB) network. The NB-network PDs are fabricated by only one step without tedious and costly lithography processes. As compared with a recovery time of 32.95 s in the single NB-based PD, a fast recovery time of 0.53 s observed in the NB-network PDs is achieved due to the existence of the NB-NB junction barriers. As the junction barriers accounting for the poor conductivity of NB networks hinder the electron transport, the dark current of the NB-network PDs is two orders of magnitude lower than that of the single NB-based PDs. The NB networks can be applicable to the building structures for nanostructured ZnO-based light-sensing applications with … | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | IEEE | en_US |
| dc.relation.ispartof | IEEE Journal of Selected Topics in Quantum Electronics | en_US |
| dc.subject | NANOWIRE | en_US |
| dc.title | Enhanced recovery speed of nanostructured ZnO photodetectors using nanobelt networks | en_US |
| dc.type | journal article | en_US |
| dc.identifier.doi | 10.1109/JSTQE.2012.2200031 | - |
| dc.identifier.isi | 000308664900022 | - |
| dc.relation.journalvolume | 18 | en_US |
| dc.relation.journalissue | 6 | en_US |
| dc.relation.pages | 1807-1811 | en_US |
| dc.identifier.eissn | 1558-4542 | en_US |
| item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
| item.cerifentitytype | Publications | - |
| item.languageiso639-1 | en_US | - |
| item.fulltext | no fulltext | - |
| item.grantfulltext | none | - |
| item.openairetype | journal article | - |
| crisitem.author.dept | National Taiwan Ocean University,NTOU | - |
| crisitem.author.dept | College of Engineering | - |
| crisitem.author.dept | Department of Optoelectronics and Materials Technology | - |
| crisitem.author.parentorg | National Taiwan Ocean University,NTOU | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| 顯示於: | 光電與材料科技學系 | |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。